| Equipement |
X-AFM: AFM that can be installed in Synchrotron X-Ray beamlines.
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| Measure |
Correlate sample topology and mechanics observed by AFM with structural characterization provided by Grazing Incidence X-Ray techniques (Surface Diffraction and Small Angle Scattering, GUXD, GISAXS). |
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Our X-AFM can acquire AFM images up to 1 image/seconds. It can be mounted on the hexapodes of several X-Ray beamlines allowing for a sufficient mechanical stability for AFM operation. |
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 X-Ray-AFM (left) that can be installed in Synchrotron X-Ray beamlines (ID03 at the ESRF, right). Equiped with complete Nanonis SPECS control unit. |
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| Specifications | For technical info about X-AFM, please read https://doi.org/10.1107/S1600577515016318 | |
| Room | 1A11@CBS60 | |