Correlative AFM with Super-Resolution, TIRF or Confocal/FLIM

Correlate biomolecules activity observed by Fluorescence (Epi and TIRF), Super Resolution Microscopy (PALM/STORM) or Confocal and Fluorescence Spectroscopy (FLIM, FRET, FCS) with the associated sample topology and mechanics observed by AFM.

Our two fluorescence-AFM correlative setups are mounted on top of Zeiss inverted microscopes. Fast AFM imaging (1 frame in few seconds) can be performed simultaneously with the fluorescence microscopy operation.

Amphiphatic Lipid Packing Sensors (ALPS, left), and DOPE (Rhodamin marked, center) TIRF image correlated with the AFM image of the model membrane + biomolecules on the right. Scan size = 10 µm.

Correlative AFM with Super-Resolution Fluorescence, TIRF and EPI

Correlative AFM with Fluorescence Spectroscopy

AFM imaging at high resolution in liquid

Characterize biological samples topography at nanoscale in dry or liquid environment. Image acquisition can be performed in static or dynamic modes

The technique allows characterizing sample morphology at nanoscale. Images are acquired by scanning a nanometric tip in gentle contact or intermittent contact with the sample. The tip is positioned at the end of a micrometric force transducer, the AFM cantilever: it records the variation of sample topography due to changes of tip-sample interaction during scanning operation. In addition, by measuring the tip-sample interaction force as a function of the tip-sample distance, AFMs can evaluate sample elastic and viscous properties.

Cholera Toxin B-oligomers (left) bound to GM1 domains within a DOPC-DPPC (1:1) model membrane (right) as observed by AFM. Milhiet, Pierre Emmanuel, et al. "AFM characterization of model rafts in supported bilayers." Single molecules 2.2 (2001): 109-112

Correlative AFM with Super-Resolution Fluorescence, TIRF and EPI

Correlative AFM with Fluorescence Spectroscopy

High-Speed Atomic Force Microscopy

Multimode equipped with Nanoscope VIII (BRUKER)

Multimode equipped with Nanoscope III (BRUKER)

X-AFM: AFM that can be installed in Synchrotron X-Ray beamlines.

Mechanical properties

Evaluation of mechanical properties of biomolecules and cells.

The technique allows characterizing the mechanical properties of the sample at high spatial resolution by means of Force Spectroscopy, Quantitative-Imaging or Peak-Force Tapping. Making use of the AFM tip as a nanometric indenter, we can characterize the extrinsic and, if possible, the intrinsic rigidity of materials with high spatial resolution.

Left: DOPC-DPPC (1:1) model membrane morphology. Right: corresponding Young modulus evaluated modeling the tip-sample mechanical contact with the Hertz theory.

Correlative AFM with Super-Resolution Fluorescence, TIRF and EPI

Correlative AFM with Fluorescence Spectroscopy

High-Speed Atomic Force Microscopy

Multimode equipped with Nanoscope VIII (BRUKER)

X-AFM: AFM that can be installed in Synchrotron X-Ray beamlines.